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Link to original content: https://dblp.org/rec/journals/mj/MukhiyaBBLZ11.ris
Provider: Schloss Dagstuhl - Leibniz Center for Informatics Database: dblp computer science bibliography Content:text/plain; charset="utf-8" TY - JOUR ID - DBLP:journals/mj/MukhiyaBBLZ11 AU - Mukhiya, Ravindra AU - Bagolini, Alvise AU - Bhattacharyya, T. K. AU - Lorenzelli, Leandro AU - Zen, M. TI - Experimental study and analysis of corner compensation structures for CMOS compatible bulk micromachining using 25 wt% TMAH. JO - Microelectron. J. VL - 42 IS - 1 SP - 127 EP - 134 PY - 2011// DO - 10.1016/J.MEJO.2010.08.018 UR - https://doi.org/10.1016/j.mejo.2010.08.018 ER -