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Link to original content: https://dblp.org/rec/journals/ieicet/NakasatoIOF08.rdf
Masato Nakasato et al.: Design for Testability Method to Avoid Error Masking of Software-Based Self-Test for Processors. (2008) journals/ieicet/NakasatoIOF08 10.1093/IETISY/E91-D.3.763 Design for Testability Method to Avoid Error Masking of Software-Based Self-Test for Processors. 4 Masato Nakasato 1 Michiko Inoue 2 Satoshi Ohtake 3 Hideo Fujiwara 4 763-770 IEICE Trans. Inf. Syst. IEICE Trans. Inf. Syst. 91-D 3 2008 provenance information for RDF data of dblp record 'journals/ieicet/NakasatoIOF08' 2020-04-11T15:26:19+0200