Masato Nakasato et al.: Design for Testability Method to Avoid Error Masking of Software-Based Self-Test for Processors. (2008)journals/ieicet/NakasatoIOF0810.1093/IETISY/E91-D.3.763Design for Testability Method to Avoid Error Masking of Software-Based Self-Test for Processors.4Masato Nakasato1Michiko Inoue2Satoshi Ohtake3Hideo Fujiwara4763-770IEICE Trans. Inf. Syst.IEICE Trans. Inf. Syst.91-D32008provenance information for RDF data of dblp record 'journals/ieicet/NakasatoIOF08'2020-04-11T15:26:19+0200