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Link to original content: https://dblp.org/rec/journals/ieicet/InoueTYF12.ris
Provider: Schloss Dagstuhl - Leibniz Center for Informatics Database: dblp computer science bibliography Content:text/plain; charset="utf-8" TY - JOUR ID - DBLP:journals/ieicet/InoueTYF12 AU - Inoue, Michiko AU - Taketani, Akira AU - Yoneda, Tomokazu AU - Fujiwara, Hideo TI - Test Pattern Ordering and Selection for High Quality Test Set under Constraints. JO - IEICE Trans. Inf. Syst. VL - 95-D IS - 12 SP - 3001 EP - 3009 PY - 2012// DO - 10.1587/TRANSINF.E95.D.3001 UR - https://doi.org/10.1587/transinf.E95.D.3001 UR - http://search.ieice.org/bin/summary.php?id=e95-d_12_3001 ER -