Provider: Schloss Dagstuhl - Leibniz Center for Informatics
Database: dblp computer science bibliography
Content:text/plain; charset="utf-8"
TY - JOUR
ID - DBLP:journals/ieicet/InoueTYF12
AU - Inoue, Michiko
AU - Taketani, Akira
AU - Yoneda, Tomokazu
AU - Fujiwara, Hideo
TI - Test Pattern Ordering and Selection for High Quality Test Set under Constraints.
JO - IEICE Trans. Inf. Syst.
VL - 95-D
IS - 12
SP - 3001
EP - 3009
PY - 2012//
DO - 10.1587/TRANSINF.E95.D.3001
UR - https://doi.org/10.1587/transinf.E95.D.3001
UR - http://search.ieice.org/bin/summary.php?id=e95-d_12_3001
ER -