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Link to original content: https://dblp.org/rec/journals/et/LuT23.ris
Provider: Schloss Dagstuhl - Leibniz Center for Informatics Database: dblp computer science bibliography Content:text/plain; charset="utf-8" TY - JOUR ID - DBLP:journals/et/LuT23 AU - Lu, Shyue-Kung AU - Tsai, Zeng-Long TI - E3C Techniques for Protecting NAND Flash Memories. JO - J. Electron. Test. VL - 39 IS - 4 SP - 487 EP - 500 PY - 2023/08/ DO - 10.1007/S10836-023-06075-6 UR - https://doi.org/10.1007/s10836-023-06075-6 ER -