Provider: Schloss Dagstuhl - Leibniz Center for Informatics
Database: dblp computer science bibliography
Content:text/plain; charset="utf-8"
TY - JOUR
ID - DBLP:journals/eswa/WangYHCC11
AU - Wang, Chia-Nan
AU - Yang, Gino K.
AU - Hung, Kuo-Chen
AU - Chang, Kuei-Hu
AU - Chu, Peter
TI - Evaluating the manufacturing capability of a lithographic area by using a novel vague GERT.
JO - Expert Syst. Appl.
VL - 38
IS - 1
SP - 923
EP - 932
PY - 2011//
DO - 10.1016/J.ESWA.2010.07.074
UR - https://doi.org/10.1016/j.eswa.2010.07.074
ER -