Yonghee Shin et al.: On the use of calling structure information to improve fault prediction. (2012)journals/ese/ShinBOW1210.1007/S10664-011-9165-9Q57431025On the use of calling structure information to improve fault prediction.4Yonghee Shin1Robert M. Bell2Thomas J. Ostrand3Elaine J. Weyuker4390-423Empir. Softw. Eng.Empir. Softw. Eng.174-52012provenance information for RDF data of dblp record 'journals/ese/ShinBOW12'2020-08-25T16:58:32+0200