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https://dblp.org/rec/journals/cluster/LohY14.nt
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"Woong-Kee Loh and Ju Young Yun: A parallel algorithm for robust fault detection in semiconductor manufacturing processes. (2014)" .
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_:ID_b488f42f4b58c81e8c7f1fd7a18bfddd . _:ID_b488f42f4b58c81e8c7f1fd7a18bfddd
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"journals/cluster/LohY14" .
_:ID_b526fc78acc9786179ef22bf8525c8c3 . _:ID_b526fc78acc9786179ef22bf8525c8c3
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"10.1007/S10586-014-0366-Z" .
"A parallel algorithm for robust fault detection in semiconductor manufacturing processes." .
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"2"^^
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_:Sig_1221aef1f52f57daea17da9a4b628d99_1 . _:Sig_1221aef1f52f57daea17da9a4b628d99_1
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"Woong-Kee Loh" . _:Sig_1221aef1f52f57daea17da9a4b628d99_1
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"1"^^
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_:Sig_1221aef1f52f57daea17da9a4b628d99_2 . _:Sig_1221aef1f52f57daea17da9a4b628d99_2
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"Ju Young Yun" . _:Sig_1221aef1f52f57daea17da9a4b628d99_2
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"2"^^
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"643-651" .
"Clust. Comput." .
"Clust. Comput." .
"17" .
"3" .
"2014"^^
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"provenance information for RDF data of dblp record 'journals/cluster/LohY14'" .
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"2020-09-29T11:01:15+0200" .
