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Link to original content: https://dblp.org/rec/conf/smc/GyimahGMNHO21.ris
Provider: Schloss Dagstuhl - Leibniz Center for Informatics Database: dblp computer science bibliography Content:text/plain; charset="utf-8" TY - CPAPER ID - DBLP:conf/smc/GyimahGMNHO21 AU - Gyimah, Nana Kankam AU - Girma, Abenezer AU - Mahmoud, Mahmoud Nabil AU - Nateghi, Shamila AU - Homaifar, Abdollah AU - Opoku, Daniel TI - A Robust Completed Local Binary Pattern (RCLBP) for Surface Defect Detection. BT - 2021 IEEE International Conference on Systems, Man, and Cybernetics, SMC 2021, Melbourne, Australia, October 17-20, 2021 SP - 1927 EP - 1934 PY - 2021// DO - 10.1109/SMC52423.2021.9659140 UR - https://doi.org/10.1109/SMC52423.2021.9659140 ER -