Michihiro Shintani et al.: Artificial Neural Network Based Test Escape Screening Using Generative Model. (2018)conf/itc/ShintaniIN1810.1109/TEST.2018.8624821Artificial Neural Network Based Test Escape Screening Using Generative Model.3Michihiro Shintani1Michiko Inoue2Yoshiyuki Nakamura31-8ITCITC20182018provenance information for RDF data of dblp record 'conf/itc/ShintaniIN18'2023-03-21T21:02:05+0100