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Link to original content: https://dblp.org/rec/conf/itc/ShintaniIN18.rdf
Michihiro Shintani et al.: Artificial Neural Network Based Test Escape Screening Using Generative Model. (2018) conf/itc/ShintaniIN18 10.1109/TEST.2018.8624821 Artificial Neural Network Based Test Escape Screening Using Generative Model. 3 Michihiro Shintani 1 Michiko Inoue 2 Yoshiyuki Nakamura 3 1-8 ITC ITC 2018 2018 provenance information for RDF data of dblp record 'conf/itc/ShintaniIN18' 2023-03-21T21:02:05+0100