Provider: Schloss Dagstuhl - Leibniz Center for Informatics
Database: dblp computer science bibliography
Content:text/plain; charset="utf-8"
TY - CPAPER
ID - DBLP:conf/issoc/TatenguemSGRB12
AU - Tatenguem, Hervé
AU - Strano, Alessandro
AU - Govind, Vineeth
AU - Raik, Jaan
AU - Bertozzi, Davide
TI - Ultra-low latency NoC testing via pseudo-random test pattern compaction.
BT - 2012 International Symposium on System on Chip, ISSoC 2012, Tampere, Finland, October 10-12, 2012
SP - 1
EP - 6
PY - 2012//
DO - 10.1109/ISSOC.2012.6376370
UR - https://doi.org/10.1109/ISSoC.2012.6376370
ER -
