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Link to original content: https://dblp.org/rec/conf/isqed/PanG10.html?view=bibtex
dblp: BibTeX record conf/isqed/PanG10

BibTeX record conf/isqed/PanG10

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@inproceedings{DBLP:conf/isqed/PanG10,
  author       = {Xin Pan and
                  Helmut Graeb},
  title        = {Reliability analysis of analog circuits by lifetime yield prediction
                  using worst-case distance degradation rate},
  booktitle    = {11th International Symposium on Quality of Electronic Design {(ISQED}
                  2010), 22-24 March 2010, San Jose, CA, {USA}},
  pages        = {861--865},
  publisher    = {{IEEE}},
  year         = {2010},
  url          = {https://doi.org/10.1109/ISQED.2010.5450477},
  doi          = {10.1109/ISQED.2010.5450477},
  timestamp    = {Wed, 16 Oct 2019 14:14:55 +0200},
  biburl       = {https://dblp.org/rec/conf/isqed/PanG10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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