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Link to original content: https://dblp.org/rec/conf/isqed/GuptaDKKA08.ris
Provider: Schloss Dagstuhl - Leibniz Center for Informatics Database: dblp computer science bibliography Content:text/plain; charset="utf-8" TY - CPAPER ID - DBLP:conf/isqed/GuptaDKKA08 AU - Gupta, Aseem AU - Dutt, Nikil D. AU - Kurdahi, Fadi J. AU - Khouri, Kamal S. AU - Abadir, Magdy S. TI - Thermal Aware Global Routing of VLSI Chips for Enhanced Reliability. BT - 9th International Symposium on Quality of Electronic Design (ISQED 2008), 17-19 March 2008, San Jose, CA, USA SP - 470 EP - 475 PY - 2008// DO - 10.1109/ISQED.2008.4479779 UR - https://doi.org/10.1109/ISQED.2008.4479779 UR - https://doi.ieeecomputersociety.org/10.1109/ISQED.2008.16 ER -