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https://dblp.org/rec/conf/irps/ZhaoRCTKRDBWKF24.xml
Ying Zhao
Pietro Rinaudo
Adrian Vaisman Chasin
Brecht Truijen
Ben Kaczer
Nouredine Rassoul
Harold Dekkers
Attilio Belmonte
Ingrid De Wolf
Gouri Sankar Kar
Jacopo Franco
Fundamental understanding of NBTI degradation mechanism in IGZO channel devices.
1-7
2024
IRPS
https://doi.org/10.1109/IRPS48228.2024.10529352
conf/irps/2024
db/conf/irps/irps2024.html#ZhaoRCTKRDBWKF24