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https://dblp.org/rec/conf/irps/ZhangWWLWLLBH23.nt
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"Xinyi Zhang et al.: Influence of Back Gate Bias on the Hot Carrier Reliability of DSOI nMOSFET. (2023)" .
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_:ID_6f6fee4ba9d7f70582186e1f8dce3d44 . _:ID_6f6fee4ba9d7f70582186e1f8dce3d44
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"conf/irps/ZhangWWLWLLBH23" .
_:ID_771d0db51eeeb5c80150289ab2ee6e71 . _:ID_771d0db51eeeb5c80150289ab2ee6e71
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"10.1109/IRPS48203.2023.10117718" .
"Influence of Back Gate Bias on the Hot Carrier Reliability of DSOI nMOSFET." .
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"9"^^
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_:Sig_21fd99ad8fea68c134a6198173e0af00_1 . _:Sig_21fd99ad8fea68c134a6198173e0af00_1
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"Xinyi Zhang" . _:Sig_21fd99ad8fea68c134a6198173e0af00_1
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"1"^^
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_:Sig_21fd99ad8fea68c134a6198173e0af00_2 . _:Sig_21fd99ad8fea68c134a6198173e0af00_2
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"Kewei Wang" . _:Sig_21fd99ad8fea68c134a6198173e0af00_2
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"2"^^
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_:Sig_21fd99ad8fea68c134a6198173e0af00_3 . _:Sig_21fd99ad8fea68c134a6198173e0af00_3
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"Fang Wang" . _:Sig_21fd99ad8fea68c134a6198173e0af00_3
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"3"^^
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_:Sig_21fd99ad8fea68c134a6198173e0af00_4 . _:Sig_21fd99ad8fea68c134a6198173e0af00_4
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"Jiangjiang Li" . _:Sig_21fd99ad8fea68c134a6198173e0af00_4
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"4"^^
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_:Sig_21fd99ad8fea68c134a6198173e0af00_5 . _:Sig_21fd99ad8fea68c134a6198173e0af00_5
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"Zhicheng Wu" . _:Sig_21fd99ad8fea68c134a6198173e0af00_5
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"5"^^
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_:Sig_21fd99ad8fea68c134a6198173e0af00_6 . _:Sig_21fd99ad8fea68c134a6198173e0af00_6
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"Duoli Li" . _:Sig_21fd99ad8fea68c134a6198173e0af00_6
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"6"^^
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_:Sig_21fd99ad8fea68c134a6198173e0af00_7 . _:Sig_21fd99ad8fea68c134a6198173e0af00_7
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"Bo Li" . _:Sig_21fd99ad8fea68c134a6198173e0af00_7
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"7"^^
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_:Sig_21fd99ad8fea68c134a6198173e0af00_8 . _:Sig_21fd99ad8fea68c134a6198173e0af00_8
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"Jianhui Bu" . _:Sig_21fd99ad8fea68c134a6198173e0af00_8
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"8"^^
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_:Sig_21fd99ad8fea68c134a6198173e0af00_9 . _:Sig_21fd99ad8fea68c134a6198173e0af00_9
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"Zhengsheng Han" . _:Sig_21fd99ad8fea68c134a6198173e0af00_9
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"9"^^
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"1-5" .
"IRPS" .
"IRPS" .
"2023"^^
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"2023"^^
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"provenance information for RDF data of dblp record 'conf/irps/ZhangWWLWLLBH23'" .
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"2023-05-24T09:43:42+0200" .