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https://dblp.org/rec/conf/irps/WuFTRTVBGLK21.xml
Zhicheng Wu
Jacopo Franco
Brecht Truijen
Philippe Roussel
Stanislav Tyaginov
Michiel Vandemaele
Erik Bury
Guido Groeseneken
Dimitri Linten
Ben Kaczer
Physics-based device aging modelling framework for accurate circuit reliability assessment.
1-6
2021
IRPS
https://doi.org/10.1109/IRPS46558.2021.9405106
conf/irps/2021
db/conf/irps/irps2021.html#WuFTRTVBGLK21