iBet uBet web content aggregator. Adding the entire web to your favor.
iBet uBet web content aggregator. Adding the entire web to your favor.



Link to original content: https://dblp.org/rec/conf/irps/MahmudGTMJSZRCM19.rdf
M. Iqbal Mahmud et al.: Hot Carrier Reliability Improvement of Thicker Gate Oxide nFET Devices in Advanced FinFETs. (2019) conf/irps/MahmudGTMJSZRCM19 10.1109/IRPS.2019.8720535 Hot Carrier Reliability Improvement of Thicker Gate Oxide nFET Devices in Advanced FinFETs. 11 M. Iqbal Mahmud 1 Amit Gupta 2 Maria Toledano-Luque 3 N. Rao Mavilla 4 Jeffrey B. Johnson 5 P. Srinivasan 0002 6 A. Zainuddin 7 S. Rao 8 Salvatore Cimino 9 Byoung Min 10 Tanya Nigam 11 1-6 IRPS IRPS 2019 2019 provenance information for RDF data of dblp record 'conf/irps/MahmudGTMJSZRCM19' 2024-07-12T11:20:56+0200