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Link to original content: https://dblp.org/rec/conf/intellisys/YoonKK22.html?view=bibtex
dblp: BibTeX record conf/intellisys/YoonKK22

BibTeX record conf/intellisys/YoonKK22

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@inproceedings{DBLP:conf/intellisys/YoonKK22,
  author       = {Jeongseop Yoon and
                  Donghwan Kim and
                  Daeyoung Kim},
  editor       = {Kohei Arai},
  title        = {Arcface Based Open Set Recognition for Industrial Fault},
  booktitle    = {Intelligent Systems and Applications - Proceedings of the 2022 Intelligent
                  Systems Conference, IntelliSys 2022, Amsterdam, The Netherlands, 1-2
                  September, 2022, Volume 1},
  series       = {Lecture Notes in Networks and Systems},
  volume       = {542},
  pages        = {326--335},
  publisher    = {Springer},
  year         = {2022},
  url          = {https://doi.org/10.1007/978-3-031-16072-1\_24},
  doi          = {10.1007/978-3-031-16072-1\_24},
  timestamp    = {Thu, 01 Sep 2022 17:40:06 +0200},
  biburl       = {https://dblp.org/rec/conf/intellisys/YoonKK22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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