@inproceedings{DBLP:conf/iecon/YangD22,
author = {Junjie Yang and
Claude Delpha},
title = {Bearing Faults Detection Using Statistical Feature Extraction and
Probability Based Distance: {A} Comparative Study},
booktitle = {{IECON} 2022 - 48th Annual Conference of the {IEEE} Industrial Electronics
Society, Brussels, Belgium, October 17-20, 2022},
pages = {1--6},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/IECON49645.2022.9968305},
doi = {10.1109/IECON49645.2022.9968305},
timestamp = {Wed, 04 Jan 2023 16:48:39 +0100},
biburl = {https://dblp.org/rec/conf/iecon/YangD22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
