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Link to original content: https://dblp.org/rec/conf/iecon/KumarNVGSN23.ris
Provider: Schloss Dagstuhl - Leibniz Center for Informatics Database: dblp computer science bibliography Content:text/plain; charset="utf-8" TY - CPAPER ID - DBLP:conf/iecon/KumarNVGSN23 AU - Kumar, Logesh AU - Nadarajan, Sivakumar AU - Vaiyapuri, Viswanathan AU - Gupta, Amit AU - Soong, Boon-Hee AU - Nguyen, Hung Dinh TI - Decoupling of Demagnetization Characteristics to Improve the Turn-to-Turn Fault Detection in PMSM Using Machine Learning Methods. BT - 49th Annual Conference of the IEEE Industrial Electronics Society, IECON 2023, Singapore, October 16-19, 2023 SP - 1 EP - 6 PY - 2023// DO - 10.1109/IECON51785.2023.10312485 UR - https://doi.org/10.1109/IECON51785.2023.10312485 ER -