Provider: Schloss Dagstuhl - Leibniz Center for Informatics
Database: dblp computer science bibliography
Content:text/plain; charset="utf-8"
TY - CPAPER
ID - DBLP:conf/iecon/KumarNVGSN23
AU - Kumar, Logesh
AU - Nadarajan, Sivakumar
AU - Vaiyapuri, Viswanathan
AU - Gupta, Amit
AU - Soong, Boon-Hee
AU - Nguyen, Hung Dinh
TI - Decoupling of Demagnetization Characteristics to Improve the Turn-to-Turn Fault Detection in PMSM Using Machine Learning Methods.
BT - 49th Annual Conference of the IEEE Industrial Electronics Society, IECON 2023, Singapore, October 16-19, 2023
SP - 1
EP - 6
PY - 2023//
DO - 10.1109/IECON51785.2023.10312485
UR - https://doi.org/10.1109/IECON51785.2023.10312485
ER -