Provider: Schloss Dagstuhl - Leibniz Center for Informatics
Database: dblp computer science bibliography
Content:text/plain; charset="utf-8"
TY - CPAPER
ID - DBLP:conf/iecon/HarmoucheDD12
AU - Harmouche, Jinane
AU - Delpha, Claude
AU - Diallo, Demba
TI - Faults diagnosis and detection using principal component analysis and Kullback-Leibler divergence.
BT - 38th Annual Conference on IEEE Industrial Electronics Society, IECON 2012, Montreal, QC, Canada, October 25-28, 2012
SP - 3907
EP - 3912
PY - 2012//
DO - 10.1109/IECON.2012.6389268
UR - https://doi.org/10.1109/IECON.2012.6389268
ER -