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Link to original content: https://dblp.org/rec/conf/icmv/LeeL14.xml
Jeong-Hoon Lee Jee-Hyong Lee 0001 Feature extraction of probe mark image and automatic detection of probing pad defects in semiconductor using CSVM. 94450H 2014 ICMV https://doi.org/10.1117/12.2181518 conf/icmv/2014 db/conf/icmv/icmv2014.html#LeeL14