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https://dblp.org/rec/conf/icmv/LeeL14.xml
Jeong-Hoon Lee
Jee-Hyong Lee 0001
Feature extraction of probe mark image and automatic detection of probing pad defects in semiconductor using CSVM.
94450H
2014
ICMV
https://doi.org/10.1117/12.2181518
conf/icmv/2014
db/conf/icmv/icmv2014.html#LeeL14