Provider: Schloss Dagstuhl - Leibniz Center for Informatics
Database: dblp computer science bibliography
Content:text/plain; charset="utf-8"
TY - CPAPER
ID - DBLP:conf/glvlsi/YeWXWGY23
AU - Ye, Yuyang
AU - Wang, Zonghui
AU - Xue, Zun
AU - Wang, Ziqi
AU - Gao, Yifei
AU - Yan, Hao
TI - FPGNN-ATPG: An Efficient Fault Parallel Automatic Test Pattern Generator.
BT - Proceedings of the Great Lakes Symposium on VLSI 2023, GLSVLSI 2023, Knoxville, TN, USA, June 5-7, 2023
SP - 299
EP - 304
PY - 2023//
DO - 10.1145/3583781.3590250
UR - https://doi.org/10.1145/3583781.3590250
ER -
