Provider: Schloss Dagstuhl - Leibniz Center for Informatics
Database: dblp computer science bibliography
Content:text/plain; charset="utf-8"
TY - CPAPER
ID - DBLP:conf/ghtc/MayE17
AU - May, Gabrielle
AU - El-Shahat, Adel
TI - Battery-degradation model based on the ANN regression function for EV applications.
BT - IEEE Global Humanitarian Technology Conference, GHTC 2017, San Jose, CA, USA, October 19-22, 2017
SP - 1
EP - 3
PY - 2017//
DO - 10.1109/GHTC.2017.8239301
UR - https://doi.org/10.1109/GHTC.2017.8239301
ER -