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Link to original content: https://dblp.org/rec/conf/ghtc/MayE17.ris
Provider: Schloss Dagstuhl - Leibniz Center for Informatics Database: dblp computer science bibliography Content:text/plain; charset="utf-8" TY - CPAPER ID - DBLP:conf/ghtc/MayE17 AU - May, Gabrielle AU - El-Shahat, Adel TI - Battery-degradation model based on the ANN regression function for EV applications. BT - IEEE Global Humanitarian Technology Conference, GHTC 2017, San Jose, CA, USA, October 19-22, 2017 SP - 1 EP - 3 PY - 2017// DO - 10.1109/GHTC.2017.8239301 UR - https://doi.org/10.1109/GHTC.2017.8239301 ER -