Ilker HamzaogluJanak H. PatelReducing Test Application Time for Full Scan Embedded Cores.260-2671999conf/ftcs/1999FTCShttps://doi.org/10.1109/FTCS.1999.781060https://doi.ieeecomputersociety.org/10.1109/FTCS.1999.781060db/conf/ftcs/ftcs99.html#HamzaogluP99