Provider: Schloss Dagstuhl - Leibniz Center for Informatics
Database: dblp computer science bibliography
Content:text/plain; charset="utf-8"
TY - CPAPER
ID - DBLP:conf/dsd/Jenicek08
AU - Jenícek, Jiri
TI - Efficient Test Pattern Compression Method Using Hard Fault Preferring.
BT - 11th Euromicro Conference on Digital System Design: Architectures, Methods and Tools, DSD 2008, Parma, Italy, September 3-5, 2008
SP - 703
EP - 708
PY - 2008//
DO - 10.1109/DSD.2008.88
UR - https://doi.org/10.1109/DSD.2008.88
UR - https://doi.ieeecomputersociety.org/10.1109/DSD.2008.88
ER -