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Link to original content: https://dblp.org/rec/conf/dft/SayadiFMM14.ris
Provider: Schloss Dagstuhl - Leibniz Center for Informatics Database: dblp computer science bibliography Content:text/plain; charset="utf-8" TY - CPAPER ID - DBLP:conf/dft/SayadiFMM14 AU - Sayadi, Hossein AU - Farbeh, Hamed AU - Monazzah, Amir Mahdi Hosseini AU - Miremadi, Seyed Ghassem TI - A data recomputation approach for reliability improvement of scratchpad memory in embedded systems. BT - 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2014, Amsterdam, The Netherlands, October 1-3, 2014 SP - 228 EP - 233 PY - 2014// DO - 10.1109/DFT.2014.6962091 UR - https://doi.org/10.1109/DFT.2014.6962091 UR - https://doi.ieeecomputersociety.org/10.1109/DFT.2014.6962091 ER -