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Link to original content: https://dblp.org/rec/conf/dft/HoferSKHHB24.ris
Provider: Schloss Dagstuhl - Leibniz Center for Informatics Database: dblp computer science bibliography Content:text/plain; charset="utf-8" TY - CPAPER ID - DBLP:conf/dft/HoferSKHHB24 AU - Höfer, Julian AU - Stammler, Matthias AU - Kreß, Fabian AU - Hotfilter, Tim AU - Harbaum, Tanja AU - Becker, Jürgen TI - BayWatch: Leveraging Bayesian Neural Networks for Hardware Fault Tolerance and Monitoring. BT - IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2024, Didcot, United Kingdom, October 8-10, 2024 SP - 1 EP - 6 PY - 2024// DO - 10.1109/DFT63277.2024.10753546 UR - https://doi.org/10.1109/DFT63277.2024.10753546 ER -