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Link to original content: https://dblp.org/rec/conf/date/LiuGT23.rdf
Qiang Liu et al.: Fault Model Analysis of DRAM under Electromagnetic Fault Injection Attack. (2023) conf/date/LiuGT23 10.23919/DATE56975.2023.10137146 Fault Model Analysis of DRAM under Electromagnetic Fault Injection Attack. 3 Qiang Liu 0011 1 Longtao Guo 2 Honghui Tang 3 1-6 DATE DATE 2023 2023 provenance information for RDF data of dblp record 'conf/date/LiuGT23' 2023-06-07T22:08:01+0200