Qiang Liu et al.: Fault Model Analysis of DRAM under Electromagnetic Fault Injection Attack. (2023)conf/date/LiuGT2310.23919/DATE56975.2023.10137146Fault Model Analysis of DRAM under Electromagnetic Fault Injection Attack.3Qiang Liu 00111Longtao Guo2Honghui Tang31-6DATEDATE20232023provenance information for RDF data of dblp record 'conf/date/LiuGT23'2023-06-07T22:08:01+0200