Walter M. LindermeirThomas J. VogelsHelmut E. GraebAnalog Test Design with IDD Measurements for the Detection of Parametric and Catastrophic Faults.822-8271998conf/date/1998DATEhttps://doi.org/10.1109/DATE.1998.655953https://doi.ieeecomputersociety.org/10.1109/DATE.1998.655953http://dl.acm.org/citation.cfm?id=368426db/conf/date/date1998.html#LindermeirVG98