@inproceedings{DBLP:conf/ccece/JainPDS06,
author = {Achin Jain and
Alok R. Patnaik and
Pulak Dhar and
Vineet Srivastava},
title = {Software Defect Content Estimation: {A} Bayesian Approach},
booktitle = {Proceedings of the Canadian Conference on Electrical and Computer
Engineering, {CCECE} 2006, May 7-10, 2006, Ottawa Congress Centre,
Ottawa, Canada},
pages = {2449--2454},
publisher = {{IEEE}},
year = {2006},
url = {https://doi.org/10.1109/CCECE.2006.277482},
doi = {10.1109/CCECE.2006.277482},
timestamp = {Wed, 16 Oct 2019 14:14:49 +0200},
biburl = {https://dblp.org/rec/conf/ccece/JainPDS06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
