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"Integrated and Automated Design-for-Testability Implementation for ..."

Toshinobu Ono et al. (1997)

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DOI: 10.1109/ATS.1997.643946

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
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  - https://dblp.org/rec/conf/ats/OnoWHNY97
Toshinobu Ono, Kazuo Wakui, Hitoshi Hikima, Yoshiyuki Nakamura, Masaaki Yoshida:
Integrated and Automated Design-for-Testability Implementation for Cell-Based ICs. Asian Test Symposium 1997: 122-125

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