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https://dblp.org/rec/conf/3dic/SonedaHYL19.nt
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"Hanna Soneda et al.: Electrical Field Test Method of Resistive Open Defects between Dies by Quiescent Currents through Embedded Diodes. (2019)" .
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_:ID_93f834a18a9a4ab9a5b36980756a2ff8 . _:ID_93f834a18a9a4ab9a5b36980756a2ff8
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"conf/3dic/SonedaHYL19" .
_:ID_ab934ce69da5ac7cd22fc73a39c60286 . _:ID_ab934ce69da5ac7cd22fc73a39c60286
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"10.1109/3DIC48104.2019.9058777" .
"Electrical Field Test Method of Resistive Open Defects between Dies by Quiescent Currents through Embedded Diodes." .
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"4"^^
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_:Sig_7a862fe8bbe3f8758c4164c7a6b3ddb4_1 . _:Sig_7a862fe8bbe3f8758c4164c7a6b3ddb4_1
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"Hanna Soneda" . _:Sig_7a862fe8bbe3f8758c4164c7a6b3ddb4_1
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"1"^^
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_:Sig_7a862fe8bbe3f8758c4164c7a6b3ddb4_2 . _:Sig_7a862fe8bbe3f8758c4164c7a6b3ddb4_2
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"Masaki Hashizume" . _:Sig_7a862fe8bbe3f8758c4164c7a6b3ddb4_2
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"2"^^
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_:Sig_7a862fe8bbe3f8758c4164c7a6b3ddb4_3 . _:Sig_7a862fe8bbe3f8758c4164c7a6b3ddb4_3
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"Hiroyuki Yotsuyanagi" . _:Sig_7a862fe8bbe3f8758c4164c7a6b3ddb4_3
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"3"^^
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_:Sig_7a862fe8bbe3f8758c4164c7a6b3ddb4_4 . _:Sig_7a862fe8bbe3f8758c4164c7a6b3ddb4_4
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"Shyue-Kung Lu" . _:Sig_7a862fe8bbe3f8758c4164c7a6b3ddb4_4
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"4"^^
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"1-5" .
"3DIC" .
"3DIC" .
"2019"^^
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"2019"^^
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"provenance information for RDF data of dblp record 'conf/3dic/SonedaHYL19'" .
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"2020-04-19T18:57:24+0200" .