Toshiaki Satoh et al.: On Delay Elements in Boundary Scan Cells for Delay Testing of 3D IC Interconnection. (2019)conf/3dic/SatohYH1910.1109/3DIC48104.2019.9058908On Delay Elements in Boundary Scan Cells for Delay Testing of 3D IC Interconnection.3Toshiaki Satoh1Hiroyuki Yotsuyanagi2Masaki Hashizume31-43DIC3DIC20192019provenance information for RDF data of dblp record 'conf/3dic/SatohYH19'2020-04-19T18:57:24+0200