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dblp: Gady Golan https://dblp.org/pid/68/2540.html dblp person page RSS feed Fri, 15 Nov 2024 19:33:42 +0100 en-US daily 1 released under the CC0 1.0 license dblp@dagstuhl.de (dblp team) dblp@dagstuhl.de (dblp team) Computers/Computer_Science/Publications/Bibliographies http://www.rssboard.org/rss-specification https://dblp.org/img/logo.144x51.pngdblp: Gady Golanhttps://dblp.org/pid/68/2540.html14451 An improved reliability model for Si and GaN power FET.https://doi.org/10.1016/j.microrel.2017.12.020, , , , :
An improved reliability model for Si and GaN power FET. Microelectron. Reliab. 81: 77-89 ()]]>https://dblp.org/rec/journals/mr/GolanAAKB18Mon, 01 Jan 2018 00:00:00 +0100 Diagnostics capabilities of various electrical anomalies in Smart Grids.https://doi.org/10.1109/ISGTEurope.2013.6695390, , , :
Diagnostics capabilities of various electrical anomalies in Smart Grids. ISGT Europe : 1-5]]>https://dblp.org/rec/conf/isgteurope/BeckCKG13Tue, 01 Jan 2013 00:00:00 +0100 Investigation of the electrical transport mechanism in VOx thin films.https://doi.org/10.1016/j.microrel.2011.07.024, , :
Investigation of the electrical transport mechanism in VOx thin films. Microelectron. Reliab. 51(12): 2119-2123 ()]]>https://dblp.org/rec/journals/mr/AxelevitchGG11Sat, 01 Jan 2011 00:00:00 +0100 Novel silicon high sensitive photonic sensor.https://doi.org/10.1016/j.mejo.2008.06.012, :
Novel silicon high sensitive photonic sensor. Microelectron. J. 40(3): 435-438 ()]]>https://dblp.org/rec/journals/mj/AxelevitchG09Thu, 01 Jan 2009 00:00:00 +0100 Electric Models of Large-Scale Systems and their Analogy to Thermodynamic Systems.https://doi.org/10.1142/S0218126606003258, :
Electric Models of Large-Scale Systems and their Analogy to Thermodynamic Systems. J. Circuits Syst. Comput. 15(4): 505-519 ()]]>https://dblp.org/rec/journals/jcsc/BerkovichG06Sun, 01 Jan 2006 00:00:00 +0100 Design and analysis of a novel tunable optical filter.https://doi.org/10.1016/j.mejo.2005.05.018, , :
Design and analysis of a novel tunable optical filter. Microelectron. J. 37(4): 302-307 ()]]>https://dblp.org/rec/journals/mj/Eliahou-NivDG06Sun, 01 Jan 2006 00:00:00 +0100 Progress in vacuum photothermal processing (VPP).https://doi.org/10.1016/j.mejo.2005.07.014, :
Progress in vacuum photothermal processing (VPP). Microelectron. J. 37(5): 459-473 ()]]>https://dblp.org/rec/journals/mj/GolanA06Sun, 01 Jan 2006 00:00:00 +0100 Hot-Probe method for evaluation of impurities concentration in semiconductors.https://doi.org/10.1016/j.mejo.2006.01.014, , , :
Hot-Probe method for evaluation of impurities concentration in semiconductors. Microelectron. J. 37(9): 910-915 ()]]>https://dblp.org/rec/journals/mj/GolanAGM06Sun, 01 Jan 2006 00:00:00 +0100 Si-C multilayer quasi crystals preparation by DC magnetron sputtering.https://doi.org/10.1016/j.mejo.2006.05.016, , :
Si-C multilayer quasi crystals preparation by DC magnetron sputtering. Microelectron. J. 37(12): 1538-1542 ()]]>https://dblp.org/rec/journals/mj/GolanAG06Sun, 01 Jan 2006 00:00:00 +0100 Metal-insulator phase transition in vanadium oxides films.https://doi.org/10.1016/S0026-2692(03)00002-8, , , :
Metal-insulator phase transition in vanadium oxides films. Microelectron. J. 34(4): 255-258 ()]]>https://dblp.org/rec/journals/mj/GolanASG03Wed, 01 Jan 2003 00:00:00 +0100 Integrated thin film heater-thermocouple systems.https://doi.org/10.1016/S0026-2714(02)00320-7, , , :
Integrated thin film heater-thermocouple systems. Microelectron. Reliab. 43(3): 509-512 ()]]>https://dblp.org/rec/journals/mr/GolanASG03Wed, 01 Jan 2003 00:00:00 +0100 Inversion phenomenon as a result of junction damages in neutron irradiated silicon detectors.https://doi.org/10.1016/S0026-2714(00)00212-2, , , , , , , , :
Inversion phenomenon as a result of junction damages in neutron irradiated silicon detectors. Microelectron. Reliab. 41(1): 67-72 ()]]>https://dblp.org/rec/journals/mr/GolanRIALRDSC01Mon, 01 Jan 2001 00:00:00 +0100 Effects of electron beam generated in vacuum photo-thermal processing on metal-silicon contacts.https://doi.org/10.1016/S0026-2714(01)00019-1, , :
Effects of electron beam generated in vacuum photo-thermal processing on metal-silicon contacts. Microelectron. Reliab. 41(6): 871-879 ()]]>https://dblp.org/rec/journals/mr/GolanAR01Mon, 01 Jan 2001 00:00:00 +0100