Provider: Schloss Dagstuhl - Leibniz Center for Informatics
Database: dblp computer science bibliography
Content:text/plain; charset="utf-8"
TY - CPAPER
ID - DBLP:conf/bigcomp/ChoKPCK22
AU - Cho, Heeryon
AU - Kang, Woo Kyu
AU - Park, Youn-Soo
AU - Chae, Sun Geu
AU - Kim, Seong-Joon
TI - Multi-Label Facial Emotion Recognition Using Korean Drama Video Clips.
BT - IEEE International Conference on Big Data and Smart Computing, BigComp 2022, Daegu, Korea, Republic of, January 17-20, 2022
SP - 215
EP - 221
PY - 2022//
DO - 10.1109/BIGCOMP54360.2022.00049
UR - https://doi.org/10.1109/BigComp54360.2022.00049
ER -
TY - JOUR
ID - DBLP:journals/access/KimKB19
AU - Kim, Seong-Joon
AU - Kim, Man Soo
AU - Bae, Suk Joo
TI - Reliability Prediction of Highly Scaled MOSFET Devices via Fractal Structure of Spatial Defects.
JO - IEEE Access
VL - 7
SP - 143160
EP - 143168
PY - 2019//
DO - 10.1109/ACCESS.2019.2944955
UR - https://doi.org/10.1109/ACCESS.2019.2944955
ER -
TY - JOUR
ID - DBLP:journals/envsoft/AhnK19
AU - Ahn, So-Ra
AU - Kim, Seong-Joon
TI - Assessment of watershed health, vulnerability and resilience for determining protection and restoration Priorities.
JO - Environ. Model. Softw.
VL - 122
PY - 2019//
DO - 10.1016/J.ENVSOFT.2017.03.014
UR - https://doi.org/10.1016/j.envsoft.2017.03.014
UR - https://www.wikidata.org/entity/Q113102222
ER -
TY - JOUR
ID - DBLP:journals/ress/KimMB19
AU - Kim, Seong-Joon
AU - Mun, Byeong Min
AU - Bae, Suk Joo
TI - A cost-driven reliability demonstration plan based on accelerated degradation tests.
JO - Reliab. Eng. Syst. Saf.
VL - 183
SP - 226
EP - 239
PY - 2019//
DO - 10.1016/J.RESS.2018.11.017
UR - https://doi.org/10.1016/j.ress.2018.11.017
ER -
TY - JOUR
ID - DBLP:journals/jocs/BaeYK16
AU - Bae, Suk Joo
AU - Yuan, Tao
AU - Kim, Seong-Joon
TI - Bayesian degradation modeling for reliability prediction of organic light-emitting diodes.
JO - J. Comput. Sci.
VL - 17
SP - 117
EP - 125
PY - 2016//
DO - 10.1016/J.JOCS.2016.08.006
UR - https://doi.org/10.1016/j.jocs.2016.08.006
ER -
TY - JOUR
ID - DBLP:journals/tr/KimYB16
AU - Kim, Seong-Joon
AU - Yuan, Tao
AU - Bae, Suk Joo
TI - A Spatio-Temporal Defect Process Model for Competing Progressive Breakdown Modes of Ultra-Thin Gate Oxides.
JO - IEEE Trans. Reliab.
VL - 65
IS - 1
SP - 263
EP - 271
PY - 2016//
DO - 10.1109/TR.2015.2456183
UR - https://doi.org/10.1109/TR.2015.2456183
ER -
TY - JOUR
ID - DBLP:journals/ress/KimB13
AU - Kim, Seong-Joon
AU - Bae, Suk Joo
TI - Cost-effective degradation test plan for a nonlinear random-coefficients model.
JO - Reliab. Eng. Syst. Saf.
VL - 110
SP - 68
EP - 79
PY - 2013//
DO - 10.1016/J.RESS.2012.09.010
UR - https://doi.org/10.1016/j.ress.2012.09.010
ER -
TY - JOUR
ID - DBLP:journals/sensors/KimLK13
AU - Kim, Seong-Joon
AU - Lee, Impyeong
AU - Kwon, Yong Joon
TI - Simulation of a Geiger-Mode Imaging LADAR System for Performance Assessment.
JO - Sensors
VL - 13
IS - 7
SP - 8461
EP - 8489
PY - 2013//
DO - 10.3390/S130708461
UR - https://doi.org/10.3390/s130708461
UR - https://www.wikidata.org/entity/Q34792915
ER -
TY - JOUR
ID - DBLP:journals/cce/NguyenLEKY10
AU - Nguyen, Thanh D. B.
AU - Lim, Young-Il
AU - Eom, Won-Hyeon
AU - Kim, Seong-Joon
AU - Yoo, Kyung-Seun
TI - Experiment and CFD simulation of hybrid SNCR-SCR using urea solution in a pilot-scale reactor.
JO - Comput. Chem. Eng.
VL - 34
IS - 10
SP - 1580
EP - 1589
PY - 2010//
DO - 10.1016/J.COMPCHEMENG.2009.12.012
UR - https://doi.org/10.1016/j.compchemeng.2009.12.012
ER -
TY - JOUR
ID - DBLP:journals/tr/BaeKKLK08
AU - Bae, Suk Joo
AU - Kim, Seong-Joon
AU - Kim, Man Soo
AU - Lee, Bae Jin
AU - Kang, Chang Wook
TI - Degradation Analysis of Nano-Contamination in Plasma Display Panels.
JO - IEEE Trans. Reliab.
VL - 57
IS - 2
SP - 222
EP - 229
PY - 2008//
DO - 10.1109/TR.2008.917823
UR - https://doi.org/10.1109/TR.2008.917823
ER -
TY - JOUR
ID - DBLP:journals/tr/BaeKKK07
AU - Bae, Suk Joo
AU - Kim, Seong-Joon
AU - Kuo, Way
AU - Kvam, Paul H.
TI - Statistical Models for Hot Electron Degradation in Nano-Scaled MOSFET Devices.
JO - IEEE Trans. Reliab.
VL - 56
IS - 3
SP - 392
EP - 400
PY - 2007//
DO - 10.1109/TR.2007.903232
UR - https://doi.org/10.1109/TR.2007.903232
ER -
