default search action
Google
Google Scholar
Semantic Scholar
Internet Archive Scholar
CiteSeerX
ORCIDSeong-Joon Kim
Person information
Other persons with a similar name
SPARQL queries 
Refine list
refinements active!
zoomed in on ?? of ?? records
view refined list in
export refined list as
2020 – today
- 2022
[c1]Heeryon Cho, Woo Kyu Kang, Youn-Soo Park, Sun Geu Chae, Seong-Joon Kim:
Multi-Label Facial Emotion Recognition Using Korean Drama Video Clips. BigComp 2022: 215-221
2010 – 2019
- 2019
- [j10]Seong-Joon Kim, Man Soo Kim, Suk Joo Bae
:
Reliability Prediction of Highly Scaled MOSFET Devices via Fractal Structure of Spatial Defects. IEEE Access 7: 143160-143168 (2019) - [j9]So-Ra Ahn, Seong-Joon Kim:
Assessment of watershed health, vulnerability and resilience for determining protection and restoration Priorities. Environ. Model. Softw. 122 (2019) - [j8]Seong-Joon Kim, Byeong Min Mun, Suk Joo Bae:
A cost-driven reliability demonstration plan based on accelerated degradation tests. Reliab. Eng. Syst. Saf. 183: 226-239 (2019) - 2016
- [j7]Suk Joo Bae, Tao Yuan, Seong-Joon Kim:
Bayesian degradation modeling for reliability prediction of organic light-emitting diodes. J. Comput. Sci. 17: 117-125 (2016) - [j6]Seong-Joon Kim, Tao Yuan, Suk Joo Bae:
A Spatio-Temporal Defect Process Model for Competing Progressive Breakdown Modes of Ultra-Thin Gate Oxides. IEEE Trans. Reliab. 65(1): 263-271 (2016) - 2013
- [j5]Seong-Joon Kim, Suk Joo Bae:
Cost-effective degradation test plan for a nonlinear random-coefficients model. Reliab. Eng. Syst. Saf. 110: 68-79 (2013) - [j4]Seong-Joon Kim, Impyeong Lee, Yong Joon Kwon:
Simulation of a Geiger-Mode Imaging LADAR System for Performance Assessment. Sensors 13(7): 8461-8489 (2013) - 2010
- [j3]Thanh D. B. Nguyen, Young-Il Lim, Won-Hyeon Eom, Seong-Joon Kim, Kyung-Seun Yoo:
Experiment and CFD simulation of hybrid SNCR-SCR using urea solution in a pilot-scale reactor. Comput. Chem. Eng. 34(10): 1580-1589 (2010)
2000 – 2009
- 2008
- [j2]Suk Joo Bae, Seong-Joon Kim, Man Soo Kim, Bae Jin Lee, Chang Wook Kang:
Degradation Analysis of Nano-Contamination in Plasma Display Panels. IEEE Trans. Reliab. 57(2): 222-229 (2008) - 2007
- [j1]Suk Joo Bae, Seong-Joon Kim, Way Kuo, Paul H. Kvam:
Statistical Models for Hot Electron Degradation in Nano-Scaled MOSFET Devices. IEEE Trans. Reliab. 56(3): 392-400 (2007)
Coauthor Index
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.
Unpaywalled article links
Add open access links from 
to the list of external document links (if available).
Privacy notice: By enabling the option above, your browser will contact the API of unpaywall.org to load hyperlinks to open access articles. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Unpaywall privacy policy.
Archived links via Wayback Machine
For web page which are no longer available, try to retrieve content from the 
of the Internet Archive (if available).
Privacy notice: By enabling the option above, your browser will contact the API of archive.org to check for archived content of web pages that are no longer available. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Internet Archive privacy policy.
Reference lists
Add a list of references from 
, 
, and 
to record detail pages.
load references from crossref.org and opencitations.net
Privacy notice: By enabling the option above, your browser will contact the APIs of crossref.org, opencitations.net, and semanticscholar.org to load article reference information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Crossref privacy policy and the OpenCitations privacy policy, as well as the AI2 Privacy Policy covering Semantic Scholar.
Citation data
Add a list of citing articles from and to record detail pages.
load citations from opencitations.net
Privacy notice: By enabling the option above, your browser will contact the API of opencitations.net and semanticscholar.org to load citation information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the OpenCitations privacy policy as well as the AI2 Privacy Policy covering Semantic Scholar.
OpenAlex data
Load additional information about publications from 
.
Privacy notice: By enabling the option above, your browser will contact the API of openalex.org to load additional information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the information given by OpenAlex.
last updated on 2024-04-25 05:56 CEST by the dblp team
all metadata released as open data under CC0 1.0 license
see also: Terms of Use | Privacy Policy | Imprint
dblp was originally created in 1993 at:
since 2018, dblp has been operated and maintained by:
the dblp computer science bibliography is funded and supported by:
