@inproceedings{DBLP:conf/itc/TakahashiMO11,
author = {Yasuhiro Takahashi and
Akinori Maeda and
Mitsuhiro Ogura},
editor = {Bill Eklow and
R. D. (Shawn) Blanton},
title = {Actual implementation of multi domain test: Further reduction of cost
of test},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2011, Anaheim, CA,
USA, September 20-22, 2011},
pages = {1--8},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/TEST.2011.6139135},
doi = {10.1109/TEST.2011.6139135},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/TakahashiMO11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/TakahashiM11,
author = {Yasuhiro Takahashi and
Akinori Maeda},
title = {Multi Domain Test: Novel test strategy to reduce the Cost of Test},
booktitle = {29th {IEEE} {VLSI} Test Symposium, {VTS} 2011, May 1-5, 2011, Dana
Point, California, {USA}},
pages = {303--308},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/VTS.2011.5783738},
doi = {10.1109/VTS.2011.5783738},
timestamp = {Wed, 16 Oct 2019 14:14:54 +0200},
biburl = {https://dblp.org/rec/conf/vts/TakahashiM11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/Maeda08,
author = {Akinori Maeda},
title = {Low Distortion Sine Waveform Generation by an {AWG}},
booktitle = {17th {IEEE} Asian Test Symposium, {ATS} 2008, Sapporo, Japan, November
24-27, 2008},
pages = {147},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/ATS.2008.28},
doi = {10.1109/ATS.2008.28},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/Maeda08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Maeda08,
author = {Akinori Maeda},
editor = {Douglas Young and
Nur A. Touba},
title = {A Method to Generate a Very Low Distortion, High Frequency Sine Waveform
Using an {AWG}},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--8},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700607},
doi = {10.1109/TEST.2008.4700607},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Maeda08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/Maeda07,
author = {Akinori Maeda},
title = {How the noise floor affects the production yield},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {474},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.116},
doi = {10.1109/ATS.2007.116},
timestamp = {Wed, 09 Nov 2022 21:30:34 +0100},
biburl = {https://dblp.org/rec/conf/ats/Maeda07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Maeda92,
author = {Akinori Maeda},
title = {The Advanced Test System Architecture Provides Fast and Accurate Test
for a High Resolution {ADC}},
booktitle = {Proceedings {IEEE} International Test Conference 1992, Discover the
New World of Test and Design, Baltimore, Maryland, USA, September
20-24, 1992},
pages = {68--75},
publisher = {{IEEE} Computer Society},
year = {1992},
url = {https://doi.org/10.1109/TEST.1992.527805},
doi = {10.1109/TEST.1992.527805},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Maeda92.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
