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ORCIDKyungmee O. Kim
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2020 – today
- 2023
[j13]Kyungmee O. Kim, Seongjun Park, Yujin Hong:
Reliability maximization of a load-sharing system without redundant components. Qual. Reliab. Eng. Int. 39(8): 3303-3315 (2023)
2010 – 2019
- 2018
- [j12]Kyungmee O. Kim
, Ming Jian Zuo:
General model for the risk priority number in failure mode and effects analysis. Reliab. Eng. Syst. Saf. 169: 321-329 (2018) - [j11]Kyungmee O. Kim, Ming Jian Zuo:
Optimal allocation of reliability improvement target based on the failure risk and improvement cost. Reliab. Eng. Syst. Saf. 180: 104-110 (2018) - 2016
- [j10]Kyungmee O. Kim, Taeseong Roh, Jae-Woo Lee, Ming Jian Zuo:
Derating design for optimizing reliability and cost with an application to liquid rocket engines. Reliab. Eng. Syst. Saf. 146: 13-20 (2016) - 2013
- [j9]Kyungmee O. Kim, Yoonjung Yang, Ming Jian Zuo:
A new reliability allocation weight for reducing the occurrence of severe failure effects. Reliab. Eng. Syst. Saf. 117: 81-88 (2013) - 2012
- [j8]Donghoh Kim, Kyungmee O. Kim, Hee-Seok Oh:
Extending the Scope of Empirical Mode Decomposition by Smoothing. EURASIP J. Adv. Signal Process. 2012: 168 (2012) - 2011
- [j7]Kyungmee O. Kim:
Burn-in considering yield loss and reliability gain for integrated circuits. Eur. J. Oper. Res. 212(2): 337-344 (2011)
2000 – 2009
- 2009
- [j6]Kyungmee O. Kim, Way Kuo:
Optimal burn-in for maximizing reliability of repairable non-series systems. Eur. J. Oper. Res. 193(1): 140-151 (2009) - 2008
- [j5]Kyungmee O. Kim, Hee-Seok Oh:
Reliability functions estimated from commonly used yield models. Microelectron. Reliab. 48(3): 481-489 (2008) - 2007
- [j4]Kyungmee O. Kim, Ming Jian Zuo:
Two fault classification methods for large systems when available data are limited. Reliab. Eng. Syst. Saf. 92(5): 585-592 (2007) - 2006
- [j3]Kyungmee O. Kim:
Relating integrated circuit yield and time-dependent reliability for various defect density distributions. IEEE Trans. Reliab. 55(2): 307-313 (2006) - 2005
- [j2]Kyungmee O. Kim, W. Kuo:
Some considerations on system burn-in. IEEE Trans. Reliab. 54(2): 207-214 (2005) - 2004
- [j1]Kyungmee O. Kim, Way Kuo, Wen Luo:
A relation model of gate oxide yield and reliability. Microelectron. Reliab. 44(3): 425-434 (2004)
Coauthor Index
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