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David San Segundo Bello
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2020 – today
- 2020
- [c10]Toshio Yasue, Fortunato Frazzica, Annachiara Spagnolo, David San Segundo Bello, Maarten De Bock, Piet Wambacq, Jan Craninckx:
A 1st Order Incremental Sigma-Delta with Refined Digitally Implemented Feed-Forward for 2-stage ADC. IEEE SENSORS 2020: 1-4
2010 – 2019
- 2018
- [j6]Lin-Kun Wu, David San Segundo Bello, Philippe Coppejans, Jan Craninckx, Andreas Süss, Maarten Rosmeulen, Piet Wambacq, Jonathan Borremans:
Analysis and Design of a CMOS Ultra-High-Speed Burst Mode Imager with In-Situ Storage Topology Featuring In-Pixel CDS Amplification. Sensors 18(11): 3683 (2018) - [j5]Gemma Taverni, Diederik Paul Moeys, Cheng-Han Li, Celso Cavaco, Vasyl Motsnyi, David San Segundo Bello, Tobi Delbrück:
Front and Back Illuminated Dynamic and Active Pixel Vision Sensors Comparison. IEEE Trans. Circuits Syst. II Express Briefs 65-II(5): 677-681 (2018) - [c9]Gemma Taverni, Diederik Paul Moeys, Cheng-Han Li, Tobi Delbrück, Celso Cavaco, Vasyl Motsnyi, David San Segundo Bello:
Live Demonstration: Front and Back Illuminated Dynamic and Active Pixel Vision Sensors Comparison. ISCAS 2018: 1- - 2017
- [c8]Gemma Taverni, Diederik Paul Moeys, Fabian Friedrich Voigt, Cheng-Han Li, Celso Cavaco, Vasyl Motsnyi, Stewart Berry, Pia Sipila, David San Segundo Bello, Fritjof Helmchen, Tobi Delbrück:
Live demonstration: In-vivo imaging of neural activity with dynamic vision sensors. BioCAS 2017: 1 - [c7]Gemma Taverni, Diederik Paul Moeys, Fabian Friedrich Voigt, Cheng-Han Li, Celso Cavaco, Vasyl Motsnyi, Stewart Berry, Pia Sipila, David San Segundo Bello, Fritjof Helmchen, Tobi Delbrück:
In-vivo imaging of neural activity with dynamic vision sensors. BioCAS 2017: 1-4 - [c6]Diederik Paul Moeys, Cheng-Han Li, Julien N. P. Martel, Simeon A. Bamford, Luca Longinotti, Vasyl Motsnyi, David San Segundo Bello, Tobi Delbrück:
Color temporal contrast sensitivity in dynamic vision sensors. ISCAS 2017: 1-4 - 2015
- [j4]Serena Porrazzo, Alonso Morgado, David San Segundo Bello, Chris Van Hoof, Refet Firat Yazicioglu, Arthur H. M. van Roermund, Eugenio Cantatore:
A design methodology for power-efficient reconfigurable SC ΔΣ modulators. Int. J. Circuit Theory Appl. 43(8): 1024-1041 (2015) - 2013
- [j3]Serena Porrazzo, Alonso Morgado, David San Segundo Bello, Francesco Cannillo, Chris Van Hoof, Refet Firat Yazicioglu, Arthur H. M. van Roermund, Eugenio Cantatore:
A 155 µW 88-dB DR Discrete-Time ΔΣ Modulator for Digital Hearing Aids Exploiting a Summing SAR ADC Quantizer. IEEE Trans. Biomed. Circuits Syst. 7(5): 573-582 (2013) - [c5]Serena Porrazzo, Venkata Narasimha Manyam, Alonso Morgado, David San Segundo Bello, Chris Van Hoof, Arthur H. M. van Roermund, Refet Firat Yazicioglu, Eugenio Cantatore:
A 1-V 99-to-75dB SNDR, 256Hz-16kHz bandwidth, 8.6-to-39µW reconfigurable SC ΔΣ Modulator for autonomous biomedical applications. ESSCIRC 2013: 367-370 - 2012
- [c4]Serena Porrazzo, Alonso Morgado, David San Segundo Bello, Francesco Cannillo, Chris Van Hoof, Arthur H. M. van Roermund, Eugenio Cantatore:
A 155µW 88-dB DR discrete-time ΔΣ modulator for digital hearing aid applications. BioCAS 2012: 248-251 - [c3]Adi Xhakoni, David San Segundo Bello, Georges G. E. Gielen:
Impact of TSV area on the dynamic range and frame rate performance of 3D-integrated image sensors. DATE 2012: 836-839 - 2011
- [j2]Mukul Sarkar, David San Segundo Bello, Chris Van Hoof, Albert J. P. Theuwissen:
Integrated Polarization-Analyzing CMOS Image Sensor for Detecting the Incoming Light Ray Direction. IEEE Trans. Instrum. Meas. 60(8): 2759-2767 (2011) - 2010
- [c2]Mukul Sarkar, David San Segundo Bello, Chris Van Hoof, Albert J. P. Theuwissen:
Integrated polarization analyzing CMOS Image sensor for autonomus navigation using polarized light. IEEE Conf. of Intelligent Systems 2010: 224-229 - [c1]Mukul Sarkar, David San Segundo Bello, Chris Van Hoof, Albert J. P. Theuwissen:
Integrated polarization-analyzing CMOS image sensor. ISCAS 2010: 621-624
2000 – 2009
- 2001
- [j1]David San Segundo Bello, Ronald J. W. T. Tangelder, Hans G. Kerkhoff:
Modeling a Verification Test System for Mixed-Signal Circuits. IEEE Des. Test Comput. 18(1): 63-71 (2001)
Coauthor Index
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