Provider: Schloss Dagstuhl - Leibniz Center for Informatics
Database: dblp computer science bibliography
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TY - CPAPER
ID - DBLP:conf/iiaiaai/IimaN22
AU - Iima, Hitoshi
AU - Nakamura, Yoshiyuki
TI - Hyperheuristic Method Based on Deep Reinforcement Learning.
BT - 12th International Congress on Advanced Applied Informatics, IIAI-AAI 2022, Kanazawa, Japan, July 2-8, 2022
SP - 303
EP - 306
PY - 2022//
DO - 10.1109/IIAIAAI55812.2022.00068
UR - https://doi.org/10.1109/IIAIAAI55812.2022.00068
ER -
TY - CPAPER
ID - DBLP:conf/itc/ShintaniIN18
AU - Shintani, Michihiro
AU - Inoue, Michiko
AU - Nakamura, Yoshiyuki
TI - Artificial Neural Network Based Test Escape Screening Using Generative Model.
BT - IEEE International Test Conference, ITC 2018, Phoenix, AZ, USA, October 29 - Nov. 1, 2018
SP - 1
EP - 8
PY - 2018//
DO - 10.1109/TEST.2018.8624821
UR - https://doi.org/10.1109/TEST.2018.8624821
ER -
TY - CPAPER
ID - DBLP:conf/itc-asia/NishimiSKN18
AU - Nishimi, Takeru
AU - Sato, Yasuo
AU - Kajihara, Seiji
AU - Nakamura, Yoshiyuki
TI - Good Die Prediction Modelling from Limited Test Items.
BT - IEEE International Test Conference in Asia, ITC-Asia 2018, Harbin, China, August 15-17, 2018
SP - 115
EP - 120
PY - 2018//
DO - 10.1109/ITC-ASIA.2018.00030
UR - https://doi.org/10.1109/ITC-Asia.2018.00030
ER -
TY - CPAPER
ID - DBLP:conf/dft/NakamuraT10
AU - Nakamura, Yoshiyuki
AU - Tanaka, Masashi
TI - A Multi-dimensional Iddq Testing Method Using Mahalanobis Distance.
BT - 25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2010, Kyoto, Japan, October 6-8, 2010
SP - 303
EP - 309
PY - 2010//
DO - 10.1109/DFT.2010.44
UR - https://doi.org/10.1109/DFT.2010.44
UR - https://doi.ieeecomputersociety.org/10.1109/DFT.2010.44
ER -
TY - CPAPER
ID - DBLP:conf/icids/NakamuraKTTKHNS10
AU - Nakamura, Yoshiyuki
AU - Kobayakawa, Maiko
AU - Takami, Chisato
AU - Tsuruga, Yuta
AU - Kubota, Hidekazu
AU - Hamasaki, Masahiro
AU - Nishimura, Takuichi
AU - Sunaga, Takeshi
TI - Zuzie: Collaborative Storytelling Based on Multiple Compositions.
BT - Interactive Storytelling - Third Joint Conference on Interactive Digital Storytelling, ICIDS 2010, Edinburgh, UK, November 1-3, 2010. Proceedings
SP - 117
EP - 122
PY - 2010//
DO - 10.1007/978-3-642-16638-9_15
UR - https://doi.org/10.1007/978-3-642-16638-9_15
ER -
TY - CPAPER
ID - DBLP:conf/chi/HopeNTNFHN09
AU - Hope, Tom
AU - Nakamura, Yoshiyuki
AU - Takahashi, Toru
AU - Nobayashi, Atsushi
AU - Fukuoka, Shota
AU - Hamasaki, Masahiro
AU - Nishimura, Takuichi
TI - Familial collaborations in a museum.
BT - Proceedings of the 27th International Conference on Human Factors in Computing Systems, CHI 2009, Boston, MA, USA, April 4-9, 2009
SP - 1963
EP - 1972
PY - 2009//
DO - 10.1145/1518701.1519000
UR - https://doi.org/10.1145/1518701.1519000
ER -
TY - CPAPER
ID - DBLP:conf/ats/SasakiNA08
AU - Sasaki, Tomonori
AU - Nakamura, Yoshiyuki
AU - Asaka, Toshiharu
TI - Shared At-Speed BIST for Parallel Test of SRAMs with Different Address Sizes.
BT - 17th IEEE Asian Test Symposium, ATS 2008, Sapporo, Japan, November 24-27, 2008
SP - 267
PY - 2008//
DO - 10.1109/ATS.2008.31
UR - https://doi.org/10.1109/ATS.2008.31
UR - https://doi.ieeecomputersociety.org/10.1109/ATS.2008.31
ER -
TY - CPAPER
ID - DBLP:conf/sutc/NakamuraTFH08
AU - Nakamura, Yoshiyuki
AU - Tei, Kenji
AU - Fukazawa, Yoshiaki
AU - Honiden, Shinichi
TI - Region-Based Sensor Selection for Wireless Sensor Networks.
BT - IEEE International Conference on Sensor Networks, Ubiquitous, and Trustworthy Computing (SUTC 2008), 11-13 June 2008, Taichung, Taiwan
SP - 326
EP - 331
PY - 2008//
DO - 10.1109/SUTC.2008.47
UR - https://doi.org/10.1109/SUTC.2008.47
UR - https://doi.ieeecomputersociety.org/10.1109/SUTC.2008.47
ER -
TY - JOUR
ID - DBLP:journals/tvlsi/NakamuraCSF07
AU - Nakamura, Yoshiyuki
AU - Clouqueur, Thomas
AU - Saluja, Kewal K.
AU - Fujiwara, Hideo
TI - Diagnosing At-Speed Scan BIST Circuits Using a Low Speed and Low Memory Tester.
JO - IEEE Trans. Very Large Scale Integr. Syst.
VL - 15
IS - 7
SP - 790
EP - 800
PY - 2007//
DO - 10.1109/TVLSI.2007.899235
UR - https://doi.org/10.1109/TVLSI.2007.899235
ER -
TY - CPAPER
ID - DBLP:conf/hci/HopeHIFNN07
AU - Hope, Tom
AU - Hamasaki, Masahiro
AU - Ishida, Keisuke
AU - Fujimura, Noriyuki
AU - Nakamura, Yoshiyuki
AU - Nishimura, Takuichi
TI - Locating Culture in HCI with Information Kiosks and Social Networks.
BT - Usability and Internationalization. HCI and Culture, Second International Conference on Usability and Internationalization, UI-HCII 2007, Held as Part of HCI International 2007, Beijing, China, July 22-27, 2007, Proceedings, Part I
SP - 99
EP - 107
PY - 2007//
DO - 10.1007/978-3-540-73287-7_13
UR - https://doi.org/10.1007/978-3-540-73287-7_13
ER -
TY - CPAPER
ID - DBLP:conf/ijcai/MatsuoOINNHN07
AU - Matsuo, Yutaka
AU - Okazaki, Naoaki
AU - Izumi, Kiyoshi
AU - Nakamura, Yoshiyuki
AU - Nishimura, Takuichi
AU - Hasida, Kôiti
AU - Nakashima, Hideyuki
TI - Inferring Long-term User Properties Based on Users' Location History.
BT - IJCAI 2007, Proceedings of the 20th International Joint Conference on Artificial Intelligence, Hyderabad, India, January 6-12, 2007
SP - 2159
EP - 2165
PY - 2007//
UR - http://ijcai.org/Proceedings/07/Papers/348.pdf
ER -
TY - JOUR
ID - DBLP:journals/ieicet/NakamuraCSF06
AU - Nakamura, Yoshiyuki
AU - Clouqueur, Thomas
AU - Saluja, Kewal K.
AU - Fujiwara, Hideo
TI - Error Identification in At-Speed Scan BIST Environment in the Presence of Circuit and Tester Speed Mismatch.
JO - IEICE Trans. Inf. Syst.
VL - 89-D
IS - 3
SP - 1165
EP - 1172
PY - 2006//
DO - 10.1093/IETISY/E89-D.3.1165
UR - https://doi.org/10.1093/ietisy/e89-d.3.1165
ER -
TY - JOUR
ID - DBLP:journals/ieicet/NakamuraSF06
AU - Nakamura, Yoshiyuki
AU - Savir, Jacob
AU - Fujiwara, Hideo
TI - Effect of BIST Pretest on IC Defect Level.
JO - IEICE Trans. Inf. Syst.
VL - 89-D
IS - 10
SP - 2626
EP - 2636
PY - 2006//
DO - 10.1093/IETISY/E89-D.10.2626
UR - https://doi.org/10.1093/ietisy/e89-d.10.2626
ER -
TY - CPAPER
ID - DBLP:conf/aaai/MatsuoHNNHTMBI06
AU - Matsuo, Yutaka
AU - Hamasaki, Masahiro
AU - Nakamura, Yoshiyuki
AU - Nishimura, Takuichi
AU - Hasida, Kôiti
AU - Takeda, Hideaki
AU - Mori, Junichiro
AU - Bollegala, Danushka
AU - Ishizuka, Mitsuru
TI - Spinning Multiple Social Networks for Semantic Web.
BT - Proceedings, The Twenty-First National Conference on Artificial Intelligence and the Eighteenth Innovative Applications of Artificial Intelligence Conference, July 16-20, 2006, Boston, Massachusetts, USA
SP - 1381
EP - 1387
PY - 2006//
UR - http://www.aaai.org/Library/AAAI/2006/aaai06-217.php
ER -
TY - CPAPER
ID - DBLP:conf/aaaiss/NumaTUNMHFIHNFSNNS06
AU - Numa, Kosuke
AU - Takeda, Hideaki
AU - Uematsu, Hiroki
AU - Nishimura, Takuichi
AU - Matsuo, Yutaka
AU - Hamasaki, Masahiro
AU - Fujimura, Noriyuki
AU - Ishida, Keisuke
AU - Hope, Tom
AU - Nakamura, Yoshiyuki
AU - Fujiyoshi, Satoshi
AU - Sakamoto, Kazuya
AU - Nagata, Hiroshi
AU - Nakagawa, Osamu
AU - Shinbori, Eiji
TI - A Weblog Grounded to the Real World.
BT - Computational Approaches to Analyzing Weblogs, Papers from the 2006 AAAI Spring Symposium, Technical Report SS-06-03, Stanford, California, USA, March 27-29, 2006
SP - 168
EP - 175
PY - 2006//
UR - http://www.aaai.org/Library/Symposia/Spring/2006/ss06-03-033.php
ER -
TY - CPAPER
ID - DBLP:conf/aswc/HamasakiMINNT06
AU - Hamasaki, Masahiro
AU - Matsuo, Yutaka
AU - Ishida, Keisuke
AU - Nakamura, Yoshiyuki
AU - Nishimura, Takuichi
AU - Takeda, Hideaki
TI - Community Focused Social Network Extraction.
BT - The Semantic Web - ASWC 2006, First Asian Semantic Web Conference, Beijing, China, September 3-7, 2006, Proceedings
SP - 155
EP - 161
PY - 2006//
DO - 10.1007/11836025_16
UR - https://doi.org/10.1007/11836025_16
ER -
TY - CPAPER
ID - DBLP:conf/ats/NakamuraCSF06
AU - Nakamura, Yoshiyuki
AU - Clouqueur, Thomas
AU - Saluja, Kewal K.
AU - Fujiwara, Hideo
TI - Diagnosing At-Speed Scan BIST Circuits Using a Low Speed and Low Memory Tester.
BT - 15th Asian Test Symposium, ATS 2006, Fukuoka, Japan, November 20-23, 2006
SP - 409
EP - 414
PY - 2006//
DO - 10.1109/ATS.2006.260963
UR - https://doi.org/10.1109/ATS.2006.260963
ER -
TY - CPAPER
ID - DBLP:conf/huc/HopeHMNFN06
AU - Hope, Tom
AU - Hamasaki, Masahiro
AU - Matsuo, Yutaka
AU - Nakamura, Yoshiyuki
AU - Fujimura, Noriyuki
AU - Nishimura, Takuichi
TI - Doing Community: Co-construction of Meaning and Use with Interactive Information Kiosks.
BT - UbiComp 2006: Ubiquitous Computing, 8th International Conference, UbiComp 2006, Orange County, CA, USA, September 17-21, 2006
SP - 387
EP - 403
PY - 2006//
DO - 10.1007/11853565_23
UR - https://doi.org/10.1007/11853565_23
ER -
TY - CPAPER
ID - DBLP:conf/vts/NakamuraSF06
AU - Nakamura, Yoshiyuki
AU - Savir, Jacob
AU - Fujiwara, Hideo
TI - BIST Pretest of ICs: Risks and Benefits.
BT - 24th IEEE VLSI Test Symposium (VTS 2006), 30 April - 4 May 2006, Berkeley, California, USA
SP - 142
EP - 149
PY - 2006//
DO - 10.1109/VTS.2006.23
UR - https://doi.org/10.1109/VTS.2006.23
UR - https://doi.ieeecomputersociety.org/10.1109/VTS.2006.23
ER -
TY - CPAPER
ID - DBLP:conf/webist/NumaTNMHFIHNFSNNS06
AU - Numa, Kosuke
AU - Takeda, Hideaki
AU - Nishimura, Takuichi
AU - Matsuo, Yutaka
AU - Hamasaki, Masahiro
AU - Fujimura, Noriyuki
AU - Ishida, Keisuke
AU - Hope, Tom
AU - Nakamura, Yoshiyuki
AU - Fujiyoshi, Satoshi
AU - Sakamoto, Kazuya
AU - Nagata, Hiroshi
AU - Nakagawa, Osamu
AU - Shinbori, Eiji
TI - Context-Aware Weblog to Enhance Communication among Participants in a Conference.
BT - WEBIST 2006, Proceedings of the Second International Conference on Web Information Systems and Technologies: Internet Technology / Web Interface and Applications, Setúbal, Portugal, April 11-13, 2006
SP - 400
EP - 407
PY - 2006//
ER -
TY - JOUR
ID - DBLP:journals/ieicet/NakamuraSF05
AU - Nakamura, Yoshiyuki
AU - Savir, Jacob
AU - Fujiwara, Hideo
TI - Defect Level vs. Yield and Fault Coverage in the Presence of an Unreliable BIST.
JO - IEICE Trans. Inf. Syst.
VL - 88-D
IS - 6
SP - 1210
EP - 1216
PY - 2005//
DO - 10.1093/IETISY/E88-D.6.1210
UR - https://doi.org/10.1093/ietisy/e88-d.6.1210
ER -
TY - CPAPER
ID - DBLP:conf/csreaPSC/NakamuraMSMKN05
AU - Nakamura, Yoshiyuki
AU - Miyazaki, Nobuo
AU - Sakamoto, Kazuya
AU - Motomura, Yoichi
AU - Kurata, Takeshi
AU - Nishimura, Takuichi
TI - A Location-Based Information Support Infrastructure System using CoBIT.
BT - Proceedings of the 2005 International Conference on Pervasive Systems and Computing, PSC 2005, Las Vegas, Nevada, USA, June 27-30, 2005
SP - 63
EP - 70
PY - 2005//
ER -
TY - CPAPER
ID - DBLP:conf/icdcsw/NishimuraNIN04
AU - Nishimura, Takuichi
AU - Nakamura, Yoshiyuki
AU - Itoh, Hideo
AU - Nakashima, Hideyuki
TI - System Design of Event Space Information Support Utilizing CoBITs.
BT - 24th International Conference on Distributed Computing Systems Workshops (ICDCS 2004 Workshops), 23-24 March 2004, Hachioji, Tokyo, Japan
SP - 384
EP - 387
PY - 2004//
DO - 10.1109/ICDCSW.2004.1284058
UR - https://doi.org/10.1109/ICDCSW.2004.1284058
UR - https://doi.ieeecomputersociety.org/10.1109/ICDCSW.2004.1284058
ER -
TY - CPAPER
ID - DBLP:conf/pervasive/NishimuraINYN04
AU - Nishimura, Takuichi
AU - Itoh, Hideo
AU - Nakamura, Yoshiyuki
AU - Yamamoto, Yoshinobu
AU - Nakashima, Hideyuki
TI - A Compact Battery-Less Information Terminal for Real World Interaction.
BT - Pervasive Computing, Second International Conference, PERVASIVE 2004, Vienna, Austria, April 21-23, 2004, Proceedings
SP - 124
EP - 139
PY - 2004//
DO - 10.1007/978-3-540-24646-6_8
UR - https://doi.org/10.1007/978-3-540-24646-6_8
ER -
TY - JOUR
ID - DBLP:journals/scjapan/TadaFSN03
AU - Tada, Yoshikatsu
AU - Fukuda, Nobuhiko
AU - Suzuka, Tomoyuki
AU - Nakamura, Yoshiyuki
TI - A kernel thread running on the outside of the kernel and its implementation.
JO - Syst. Comput. Jpn.
VL - 34
IS - 8
SP - 42
EP - 50
PY - 2003//
DO - 10.1002/SCJ.10305
UR - https://doi.org/10.1002/scj.10305
ER -
TY - CPAPER
ID - DBLP:conf/percom/NakamuraNIN03
AU - Nakamura, Yoshiyuki
AU - Nishimura, Takuichi
AU - Itoh, Hideo
AU - Nakashima, Hideyuki
TI - A System of Card Type Battery-Less Information Terminal: CardBIT for Situated Interactio.
BT - Proceedings of the First IEEE International Conference on Pervasive Computing and Communications (PerCom'03), March 23-26, 2003, Fort Worth, Texas, USA
SP - 369
EP - 377
PY - 2003//
DO - 10.1109/PERCOM.2003.1192761
UR - https://doi.org/10.1109/PERCOM.2003.1192761
UR - https://doi.ieeecomputersociety.org/10.1109/PERCOM.2003.1192761
ER -
TY - CPAPER
ID - DBLP:conf/ats/OnoWHNY97
AU - Ono, Toshinobu
AU - Wakui, Kazuo
AU - Hikima, Hitoshi
AU - Nakamura, Yoshiyuki
AU - Yoshida, Masaaki
TI - Integrated and Automated Design-for-Testability Implementation for Cell-Based ICs.
BT - 6th Asian Test Symposium (ATS '97), 17-18 November 1997, Akita, Japan
SP - 122
EP - 125
PY - 1997//
DO - 10.1109/ATS.1997.643946
UR - https://doi.org/10.1109/ATS.1997.643946
UR - https://doi.ieeecomputersociety.org/10.1109/ATS.1997.643946
ER -
TY - JOUR
ID - DBLP:journals/scjapan/HaradaNN95
AU - Harada, Minoru
AU - Nishimurae, Junichi
AU - Nakamura, Yoshiyuki
TI - Automatic process design from nonprocedural specification.
JO - Syst. Comput. Jpn.
VL - 26
IS - 3
SP - 1
EP - 16
PY - 1995//
DO - 10.1002/SCJ.4690260301
UR - https://doi.org/10.1002/scj.4690260301
ER -
TY - JOUR
ID - DBLP:journals/scjapan/YamadaN92
AU - Yamada, Teruhiko
AU - Nakamura, Yoshiyuki
TI - A method of diagnosing single stuck-at faults in combinational circuits.
JO - Syst. Comput. Jpn.
VL - 23
IS - 14
SP - 35
EP - 44
PY - 1992//
DO - 10.1002/SCJ.4690231404
UR - https://doi.org/10.1002/scj.4690231404
ER -
