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ORCIDPablo Martín-Lloret
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2020 – today
- 2022
[c7]Andrés Santana-Andreo
, Pablo Martín-Lloret, Elisenda Roca, Rafael Castro-López, Francisco V. Fernández:
Characterization and analysis of BTI and HCI effects in CMOS current mirrors. SMACD 2022: 1-4
2010 – 2019
- 2019
- [c6]Antonio Toro-Frías, Pablo Saraza-Canflanca, Fábio Passos, Pablo Martín-Lloret, Rafael Castro-López, Elisenda Roca, Javier Martín-Martínez, Rosana Rodríguez, Montserrat Nafría, Francisco V. Fernández:
Generation of Lifetime-Aware Pareto-Optimal Fronts Using a Stochastic Reliability Simulator. DATE 2019: 78-83 - [c5]Pablo Martín-Lloret, Juan Núñez, Elisenda Roca, Rafael Castro-López, Javier Martín-Martínez, Rosana Rodríguez, Montserrat Nafría, Francisco V. Fernández:
An IC Array for the Statistical Characterization of Time-Dependent Variability of Basic Circuit Blocks. SMACD 2019: 241-244 - 2018
- [c4]Antonio Toro-Frías, Pablo Martín-Lloret, Javier Martín-Martínez, Rafael Castro-López, Elisenda Roca, Rosana Rodríguez, Montserrat Nafría, Francisco V. Fernández:
Lifetime Calculation Using a Stochastic Reliability Simulator for Analog ICs. SMACD 2018: 1-9 - 2017
- [c3]Pablo Martín-Lloret, Antonio Toro-Frías, Javier Martín-Martínez, Rafael Castro-López, Elisenda Roca, Rosana Rodríguez, Montserrat Nafría, Francisco V. Fernández:
A size-adaptive time-step algorithm for accurate simulation of aging in analog ICs. ISCAS 2017: 1-4 - [c2]Pablo Martín-Lloret, Antonio Toro-Frías, Rafael Castro-López, Elisenda Roca, Francisco V. Fernández, Javier Martín-Martínez, Rosana Rodríguez, Montserrat Nafría:
CASE: A reliability simulation tool for analog ICs. SMACD 2017: 1-4 - [c1]Antonio Toro-Frías, Pablo Martín-Lloret, Rafael Castro-López, Elisenda Roca, Francisco V. Fernández, Javier Martín-Martínez, Rosana Rodríguez, Montserrat Nafría:
Including a stochastic model of aging in a reliability simulation flow. SMACD 2017: 1-4 - 2016
- [j1]Antonio Toro-Frías, Pablo Martín-Lloret, Javier Martín-Martínez, Rafael Castro-López, Elisenda Roca, Rosana Rodríguez, Montserrat Nafría, Francisco V. Fernández:
Reliability simulation for analog ICs: Goals, solutions, and challenges. Integr. 55: 341-348 (2016)
Coauthor Index
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