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ORCIDNicolas Guitard
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2020 – today
- 2022
[c3]Grégoire Caron, Anatoli B. Juditsky, Nicolas Guitard, Didier Céli:
Recovery of Intrinsic Heterojunction Bipolar Transistors Profiles by Neural Networks. BCICTS 2022: 228-231- 2020
- [c2]Vincent Gidel, Frédéric Gianesello, Pascal Chevalier, Grégory Avenier, Nicolas Guitard, Michel Buczko, Cyril Luxey, Guillaume Ducournau:
Smart Way to Adjust Schottky Barrier Height in 130 nm BiCMOS Process for sub-THz Applications. RWS 2020: 337-340
2010 – 2019
- 2018
- [j8]Jorge Loayza, Nicolas Guitard, Bruno Allard, Luong-Viêt Phung
, Blaise Jacquier, Philippe Galy:
Simulation, characterization and implementation of a new SCR-based device with a turn-off capability for EOS-immune ESD power supply clamps in advanced CMOS technology nodes. Microelectron. Reliab. 85: 176-189 (2018) - 2012
- [j7]Philippe Galy, Johan Bourgeat, Jean Jimenez, Nicolas Guitard, Alexandre Dray, Ghislain Troussier, Blaise Jacquier, David Marin-Cudraz:
Symmetrical ESD trigger and pull-up using BIMOS transistor in advanced CMOS technology. Microelectron. Reliab. 52(9-10): 1998-2004 (2012) - [c1]Philippe Galy, Jean Jimenez, Johan Bourgeat, A. Dray, Ghislain Troussier, Boris Heitz, Nicolas Guitard, David Marin-Cudraz, H. Beckrich-Ros:
BIMOS transistor and its applications in ESD protection in advanced CMOS technology. ICICDT 2012: 1-4
2000 – 2009
- 2007
- [j6]Yuan Gao, Nicolas Guitard, Christophe Salamero, Marise Bafleur, Laurent Bary, Laurent Escotte, Patrick Gueulle, Lionel Lescouzères:
Identification of the physical signatures of CDM induced latent defects into a DC-DC converter using low frequency noise measurements. Microelectron. Reliab. 47(9-11): 1456-1461 (2007) - 2006
- [j5]Fabien Essely, Frédéric Darracq, Vincent Pouget, Mustapha Remmach, Felix Beaudoin, Nicolas Guitard, Marise Bafleur, Philippe Perdu, André Touboul, Dean Lewis:
Application of various optical techniques for ESD defect localization. Microelectron. Reliab. 46(9-11): 1563-1568 (2006) - 2005
- [j4]Nicolas Guitard, Fabien Essely, David Trémouilles, Marise Bafleur, Nicolas Nolhier, Philippe Perdu, André Touboul, Vincent Pouget, Dean Lewis:
Different Failure signatures of multiple TLP and HBM Stresses in an ESD robust protection structure. Microelectron. Reliab. 45(9-11): 1415-1420 (2005) - 2004
- [j3]Nicolas Guitard, David Trémouilles, Marise Bafleur, Laurent Escotte, Laurent Bary, Philippe Perdu, Gérard Sarrabayrouse, Nicolas Nolhier, Roberto Reyna-Rojas:
Low Frequency Noise Measurements for ESD Latent Defect Detection in High Reliability Applications. Microelectron. Reliab. 44(9-11): 1781-1786 (2004) - [j2]Fabien Essely, Corinne Bestory, Nicolas Guitard, Marise Bafleur, A. Wislez, E. Doche, Philippe Perdu, André Touboul, Dean Lewis:
Study of the ESD defects impact on ICs reliability. Microelectron. Reliab. 44(9-11): 1811-1815 (2004) - 2003
- [j1]David Trémouilles, Géraldine Bertrand, Marise Bafleur, Felix Beaudoin, Philippe Perdu, Nicolas Guitard, Lionel Lescouzères:
TCAD and SPICE modeling help solve ESD protection issues in analog CMOS technology. Microelectron. Reliab. 43(1): 71-79 (2003)
Coauthor Index
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