Provider: Schloss Dagstuhl - Leibniz Center for Informatics
Database: dblp computer science bibliography
Content:text/plain; charset="utf-8"
TY - CPAPER
ID - DBLP:conf/irps/SrinivasanRCZKP18
AU - Srinivasan, P.
AU - Ranjan, Rakesh
AU - Cimino, S.
AU - Zainuddin, A.
AU - Kannan, B.
AU - Pantisano, L.
AU - Mahmud, I.
AU - Dilliway, G.
AU - Nigam, Tanya
TI - Understanding gate metal work function (mWF) impact on device reliability - A holistic approach.
BT - IEEE International Reliability Physics Symposium, IRPS 2018, Burlingame, CA, USA, March 11-15, 2018
SP - 6
PY - 2018//
DO - 10.1109/IRPS.2018.8353646
UR - https://doi.org/10.1109/IRPS.2018.8353646
ER -
