Provider: Schloss Dagstuhl - Leibniz Center for Informatics
Database: dblp computer science bibliography
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TY - CPAPER
ID - DBLP:conf/essderc/AliGCLPTGFK17
AU - Ali, K. Ben
AU - Gammon, P. M.
AU - Chan, C. W.
AU - Li, F.
AU - Pathirana, V.
AU - Trajkovic, T.
AU - Gity, Farzan
AU - Flandre, Denis
AU - Kilchytska, Valeria
TI - Single event effects and total ionising dose in 600V Si-on-SiC LDMOS transistors for rad-hard space applications.
BT - 47th European Solid-State Device Research Conference, ESSDERC 2017, Leuven, Belgium, September 11-14, 2017
SP - 236
EP - 239
PY - 2017//
DO - 10.1109/ESSDERC.2017.8066635
UR - https://doi.org/10.1109/ESSDERC.2017.8066635
ER -
TY - CPAPER
ID - DBLP:conf/essderc/MirabelliGMHD17
AU - Mirabelli, Gioele
AU - Gity, Farzan
AU - Monaghan, Scott
AU - Hurley, Paul K.
AU - Duffy, Ray
TI - Impact of impurities, interface traps and contacts on MoS2 MOSFETs: Modelling and experiments.
BT - 47th European Solid-State Device Research Conference, ESSDERC 2017, Leuven, Belgium, September 11-14, 2017
SP - 288
EP - 291
PY - 2017//
DO - 10.1109/ESSDERC.2017.8066648
UR - https://doi.org/10.1109/ESSDERC.2017.8066648
ER -
