Provider: Schloss Dagstuhl - Leibniz Center for Informatics
Database: dblp computer science bibliography
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TY - JOUR
ID - DBLP:journals/mr/DemirtasJA10
AU - Demirtas, Sefa
AU - Joh, Jungwoo
AU - Alamo, Jesús A. del
TI - High voltage degradation of GaN High Electron Mobility Transistors on silicon substrate.
JO - Microelectron. Reliab.
VL - 50
IS - 6
SP - 758
EP - 762
PY - 2010//
DO - 10.1016/J.MICROREL.2010.02.016
UR - https://doi.org/10.1016/j.microrel.2010.02.016
ER -
