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Link to original content: https://dblp.dagstuhl.de/rec/journals/integration/GhoshalMS17.ris
Provider: Schloss Dagstuhl - Leibniz Center for Informatics Database: dblp computer science bibliography Content:text/plain; charset="utf-8" TY - JOUR ID - DBLP:journals/integration/GhoshalMS17 AU - Ghoshal, Bibhas AU - Mandal, Chittaranjan AU - Sengupta, Indranil TI - Refresh re-use based transparent test for detection of in-field permanent faults in DRAMs. JO - Integr. VL - 59 SP - 168 EP - 178 PY - 2017// DO - 10.1016/J.VLSI.2017.06.011 UR - https://doi.org/10.1016/j.vlsi.2017.06.011 ER -