Provider: Schloss Dagstuhl - Leibniz Center for Informatics
Database: dblp computer science bibliography
Content:text/plain; charset="utf-8"
TY - JOUR
ID - DBLP:journals/integration/GhoshalMS17
AU - Ghoshal, Bibhas
AU - Mandal, Chittaranjan
AU - Sengupta, Indranil
TI - Refresh re-use based transparent test for detection of in-field permanent faults in DRAMs.
JO - Integr.
VL - 59
SP - 168
EP - 178
PY - 2017//
DO - 10.1016/J.VLSI.2017.06.011
UR - https://doi.org/10.1016/j.vlsi.2017.06.011
ER -