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Link to original content: https://dblp.dagstuhl.de/rec/conf/vlsid/KumarPKS17.xml
Vinay Kumar Nikhil Puri Sudhir Kumar 0002 Sumit Srivastav A Sub-0.5V Reliability Aware-Negative Bitline Write-Assisted 8T DP-SRAM and WL Strapping Novel Architecture to Counter Dual Patterning Issues in 10nm FinFET. 269-274 2017 VLSID https://doi.org/10.1109/VLSID.2017.17 https://doi.ieeecomputersociety.org/10.1109/VLSID.2017.17 conf/vlsid/2017 db/conf/vlsid/vlsid2017.html#KumarPKS17