Provider: Schloss Dagstuhl - Leibniz Center for Informatics
Database: dblp computer science bibliography
Content:text/plain; charset="utf-8"
TY - CPAPER
ID - DBLP:conf/fsdm/LuLZ17
AU - Lü, Wei-feng
AU - Lin, Mi
AU - Zhang, Haipeng
TI - Investigation on Gate Capacitances Fluctuation Due to Work-Function Variation in Metal-Gate FinFETs.
BT - Fuzzy Systems and Data Mining III - Proceedings of FSDM 2017 [Hualien, Taiwan, November 2017].
SP - 398
EP - 403
PY - 2017//
DO - 10.3233/978-1-61499-828-0-398
UR - https://doi.org/10.3233/978-1-61499-828-0-398
ER -
