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Link to original content: https://dblp.dagstuhl.de/rec/conf/ets/KunduCSK13.ris
Provider: Schloss Dagstuhl - Leibniz Center for Informatics Database: dblp computer science bibliography Content:text/plain; charset="utf-8" TY - CPAPER ID - DBLP:conf/ets/KunduCSK13 AU - Kundu, Subhadip AU - Chattopadhyay, Santanu AU - Sengupta, Indranil AU - Kapur, Rohit TI - Aggresive scan chain masking for improved diagnosis of multiple scan chain failures. BT - 18th IEEE European Test Symposium, ETS 2013, Avignon, France, May 27-30, 2013 SP - 1 PY - 2013// DO - 10.1109/ETS.2013.6569383 UR - https://doi.org/10.1109/ETS.2013.6569383 UR - https://doi.ieeecomputersociety.org/10.1109/ETS.2013.6569383 ER -