Provider: Schloss Dagstuhl - Leibniz Center for Informatics
Database: dblp computer science bibliography
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TY - CPAPER
ID - DBLP:conf/ets/KunduCSK13
AU - Kundu, Subhadip
AU - Chattopadhyay, Santanu
AU - Sengupta, Indranil
AU - Kapur, Rohit
TI - Aggresive scan chain masking for improved diagnosis of multiple scan chain failures.
BT - 18th IEEE European Test Symposium, ETS 2013, Avignon, France, May 27-30, 2013
SP - 1
PY - 2013//
DO - 10.1109/ETS.2013.6569383
UR - https://doi.org/10.1109/ETS.2013.6569383
UR - https://doi.ieeecomputersociety.org/10.1109/ETS.2013.6569383
ER -