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Link to original content: https://dblp.dagstuhl.de/rec/conf/ddecs/TaheriAJDR23.ris
Provider: Schloss Dagstuhl - Leibniz Center for Informatics Database: dblp computer science bibliography Content:text/plain; charset="utf-8" TY - CPAPER ID - DBLP:conf/ddecs/TaheriAJDR23 AU - Taheri, Mahdi AU - Ahmadilivani, Mohammad Hasan AU - Jenihhin, Maksim AU - Daneshtalab, Masoud AU - Raik, Jaan TI - APPRAISER: DNN Fault Resilience Analysis Employing Approximation Errors. BT - 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2023, Tallinn, Estonia, May 3-5, 2023 SP - 124 EP - 127 PY - 2023// DO - 10.1109/DDECS57882.2023.10139468 UR - https://doi.org/10.1109/DDECS57882.2023.10139468 ER -